PaperEvidence for electron diffraction by off-coincidence grain boundaries in polycrystalline lead filmsJ.W. MatthewsScripta Metallurgica
PaperDefects in epitaxial multilayers: I. Misfit dislocationsJ.W. Matthews, A.E. BlakesleeJournal of Crystal Growth
PaperUse of misfit strain to remove dislocations from epitaxial thin filmsJ.W. Matthews, A.E. Blakeslee, et al.Thin Solid Films