Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
This paper presents a measurement framework for evaluating model-based test generation (MBTG) tools. The proposed framework is derived by using the Goal Question Metric methodology, which helps formulate the metrics of interest: complexity, ease of learning, effectiveness, efficiency, and scalability. We demonstrate the steps involved in evaluating MBTG tools by describing a case study designed for this purpose. This case study involves the use of four MBTG tools that differ in their modeling techniques, test specification techniques, and test generation algorithms. © 2006 IBM.
Hang-Yip Liu, Steffen Schulze, et al.
Proceedings of SPIE - The International Society for Optical Engineering
Raymond Wu, Jie Lu
ITA Conference 2007
Sai Zeng, Angran Xiao, et al.
CAD Computer Aided Design
Frank R. Libsch, S.C. Lien
IBM J. Res. Dev