Conference paper
Characterization of a next generation step-and-scan system
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
We present a linear-time algorithm that finds all edges and vertices in the intersection of all odd cycles in a given graph. We also show an application of our algorithm to a variant of the satisfiability problem of Boolean formulas.
Timothy J. Wiltshire, Joseph P. Kirk, et al.
SPIE Advanced Lithography 1998
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ISIT 2005
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