Conference paper
Characterization of line width variation
Alfred K. Wong, Antoinette F. Molless, et al.
SPIE Advanced Lithography 2000
Paper
A heuristic algorithm for the solution of seriation problems
Abstract
No abstract available.
Related
Yixiong Chen, Weichuan Fang
Engineering Analysis with Boundary Elements
Robert Manson Sawko, Malgorzata Zimon
SIAM/ASA JUQ
R.B. Morris, Y. Tsuji, et al.
International Journal for Numerical Methods in Engineering