F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
A transmission electron microscope imaging and diffraction investigation has been performed on small CrO2 crystallites. The acieular crystal morphology has been observed and electron-diffraction evidence is presented which indicates the presence of a very thin CrO(OH) layer of 6-13 A. CrO2 has been partly converted topotactically to orthorhombic CrO(OH) in hot water and single-crystal electron-diffraction evidence is used to establish this topotactic relationship. Under sufficiently high temperatures or electron-beam irradiation, CrO2 and CrO(OH) convert topotactically to Cr2O3, as seen from single-crystal electron-diffraction data. This last conversion is further characterized using high-resolution dark-field microscopy which reveals the presence of interference patterns from the formation of microcrystalline domains. © 1980 Taylor & Francis Group, LLC.
F.J. Himpsel, T.A. Jung, et al.
Surface Review and Letters
Julian J. Hsieh
Journal of Vacuum Science and Technology A: Vacuum, Surfaces and Films
Michiel Sprik
Journal of Physics Condensed Matter
Frank R. Libsch, Takatoshi Tsujimura
Active Matrix Liquid Crystal Displays Technology and Applications 1997