Conference paper
Challenges for silicon technology scaling in the nanoscale era
Tze-Chiang Chen
ESSCIRC 2009
An emitter-coupled logic (ECL) gate with an ac-coupled active pull-down emitter-follower stage that gives high speed at lower power is described. Significant reduction of the speed-power product can be achieved over the conventional ECL gate. The speed/power advantages of the circuit have been demonstrated in a double-poly, trench-isolated, self-aligned bipolar process with 0.8-μm (mask) emitter width. Unloaded gate delays of 21 ps at 4.1 mW/gate, 23 ps at 2.1 mW/gate, and 35 ps at 1.1 mW/gate have been measured. © 1989 IEEE
Tze-Chiang Chen
ESSCIRC 2009
Denny Duan-Lee Tang, Edward Hackbarth, et al.
IEEE T-ED
Tze-Chiang Chen
VLSI Technology 2009
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IEEE T-ED