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IBM R&D Labs in Israel

The 3rd International Workshop on Combinatorial Testing (IWCT 2014)

March 31, 2014

In conjunction with International Conference on Software Testing
(ICST 2014, March 31 - April 4)
Cleveland, Ohio USA

Call for Papers

We invite submissions of high-quality papers presenting original work on both theoretical and experimental aspects of combinatorial testing. We accept both full papers (up to 10 pages) and short papers (up to 4 pages).

New This Year: We will also have a poster session, for authors to present their work in an informal and interactive setting. Posters are ideal for presenting recent results, or case studies and industry experience. Posters that present work in progress and draw important conclusions from practical experience are especially welcome. A one-page extended abstract of the poster should be submitted for review by the submission deadline. Accepted poster abstracts will be included in the proceedings at author's request. Authors are responsible for formatting abstracts according to the IEEE publication template.

Topics of interest for papers or posters include, but are not limited to:

  • Combinatorial testing workflow
    • Modeling the input space for CT
    • Efficient algorithms to generate t-way test suites, especially involving support of constrains
    • Determination of expected system behavior for each test case
    • Executing CT test suites
    • Combinatorial testing based fault localization
    • Implementation of CT with existing testing infrastructures
    • Handling changes in test requirements
  • Applicability of combinatorial testing
    • Comparison and combination of CT with other dynamic verification methods
    • Study of failure records to determine the kind of CT which may have detected faults
    • Empirical studies and feedback from practical applications of CT
    • Combinatorial testing for concurrent and real-time systems
    • Cloud computing systems testing and use of combinatorial methods in cloud architecture
    • Application of CT in other domains, e.g., gene regulation or other biotech applications
  • Combinatorial and complementing methods
    • Combinatorial analysis of existing test suites
    • Test plan reduction and completeness
    • CT and coverage metrics – combining the two, and studying the relationship between them

The full call for papers is available for download here.

Organizing Committee