09:00 - 09:10 Introduction

09:10 - 10:30 Session 1
CT Environments and tools

CitLab: a Laboratory for Combinatorial Interaction Testing,
Angelo Gargantini and Paolo Vavassori (University of Bergamo, Italy) Presentation

Combinatorial Test Design in the TOSCA Testsuite: Lessons Learned and Practical Implications {Short paper},
Rudolf Ramler, Theodorich Kopetzky and Wolfgang Platz, (Software Competence Center Hagenberg GmbH, Austria ; TRICENTIS Technology & Consulting GmbH, Austria) Presentation

Simplified Modeling of Combinatorial Test Spaces,
Itai Segall, Rachel Tzoref-Brill and Aviad Zlotnick(IBM Haifa Research Laboratory, Israel) Presentation

10:30-11:10 – Coffee Break

11:10 - 12:30 Session 2
Experience Reports I

Effectiveness of Pair-wise Testing for Software with Boolean Inputs,
William Alton Ballance, Sergiy Vilkomir and William Jenkins (East Carolina University, USA)

Combinatorial Testing on ID3v2 Tags of MP3 Files {Short paper},
Zhiqiang Zhang, Xiaojian Liu and Jian Zhang (State Key Laboratory of Computer Science, Institute of Software, Chinese Academy of Sciences, China ; Institute of Automation, Shandong Academy of Sciences, China) Presentation

Combinatorial Testing of ACTS: A Case Study,
Mehra Nouroz Borazjany, Linbin Yu, Yu Lei, Raghu Kacker and Rick Kuhn (University of Texas at Arlington, USA ; National Institute of Standards and Technology, USA) Presentation

12:30 - 14:00 Lunch

14:00 - 15:20 Session 3
CT Test Generation and Fault Localization

Combinatorial Methods for Event Sequence Testing,
Rick Kuhn, James Higdon, James Lawrence, Raghu Kacker and Yu Lei (National Institute of Standards and Technology, USA ; Jacobs Tech. ctr. USAF, USA ; George Mason Univ., USA ; Univ. of Texas Arlington, USA) Presentation

Combinatorial Interaction Testing for Test Selection in Grammar-Based Testing,
Elke Salecker and Sabine Glesner (TU Berlin, Germany) Presentation

Isolating Failure-Inducing Combinations in Combinatorial Testing using Test Augmentation and Classification {Short paper},
Kiran Shakya, Tao Xie, Nuo Li, Yu Lei, Raghu Kracker and Richard Kuhn (North Carolina State University, USA ; ABB robotics, China ; University of Texas Arlington, USA ; National Institute of Standards and Technology, USA) Presentation

15:20 - 16:00 Coffee Break

16:00 - 17:00 Session 4
Experience Reports II

Common Patterns in Combinatorial Models,
Itai Segall, Rachel Tzoref-Brill and Aviad Zlotnick (IBM Haifa Research Laboratory, Israel) Presentation

A System Analysis Study Comparing Reverse Engineered Combinatorial Testing to Expert Judgment,
Jon Hagar and Atlee Cunningham (Lockheed Martin, USA) Presentation

17:00 - 18:00 Discussion and Closing Remarks