The general variational formulas for capacitance parameter extraction
- W.C. Chew
- L.J. Jiangt
- 2005
- IEEE Topical Meeting EPEPS 2005
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Losses caused by roughness of metallization in printed-circuit boards
- A. Deutsch
- C. Surovic
- et al.
- 2005
- IEEE Topical Meeting EPEPS 2005